JIS K 0167:2011 表面化學(xué)分析 俄歇電子光譜和X射線光電子能譜學(xué) 勻質(zhì)材料定量分析用實驗室測定相對敏感因子的使用指南
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials