Stylus profilometer method for thickness measurement of nanometer films on glass substrates

Stylus profilometer method for thickness measurement of nanometer films on glass substrates, Total:1 items.

In the international standard classification, Stylus profilometer method for thickness measurement of nanometer films on glass substrates involves: Analytical chemistry.

中華人民共和國國家質(zhì)量監(jiān)督檢驗檢疫總局、中國國家標準化管理委員會, Stylus profilometer method for thickness measurement of nanometer films on glass substrates

• GB/T 33826-2017 Measurement of nanofilm thickness on glass substrate—Profilometric method

Others:   Stylus profilometer method for thickness measurement of nanometer films on glass substrates.