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Photoelectrochemistry

Photoelectrochemistry, Total:200 items.

In the international standard classification, Photoelectrochemistry involves: General methods of tests and analysis for food products, Non-ferrous metals, Analytical chemistry, Rubber and plastics products, Aerospace electric equipment and systems, On-board equipment and instruments, Vocabularies, Wastes, Optical equipment, Fibre optic communications, Testing of metals, Glass, Geology. Meteorology. Hydrology, Solar energy engineering, Optoelectronics. Laser equipment, Construction materials, Occupational safety. Industrial hygiene, Protective equipment, Products of the textile industry, Medical equipment, Semiconductor devices, Nuclear energy engineering, Leather technology, Photography, Products of the chemical industry, Ferrous metals, Optics and optical measurements, Electrical accessories.

Group Standards of the People's Republic of China, Photoelectrochemistry

• T/SDAQI 010-2021 The rapid detection of allergens (α-lactalbumin and β-lactoglobulin) in milk
• T/ESD 3007-2020 Optical grade anti-static hardened resin board (sheet)
• T/FJAS 002-2024 wet chemicals regeneration Light blocking cleaning solution
• T/FJAS 006-2024 wet chemicals regeneration photoresist stripping solution
• T/GSEA 002-2023 Testing method for power quality of electrochemical energy storage-photovoltaic system
• T/GSEA 003-2023 In-situ test method for electrochemical energy storage-photovoltaic system
• T/IEIA 0004-2022 Technical Specifications for Electrochemical Energy Storage System of Grid-connected Photovoltaic Power Stations
• T/JSQA 157-2023 Mats for chemical mechanical polishing
• T/ICMTIA CMP0037-2023 Polyurethane chemical mechanical polishing pad for integrated circuits
• T/CSTM 00234-2020 Chemical reagent — Spectrum grade Methanol
• T/CSTM 00235-2020 Chemical reagent — Spectrum grade Acetonitrile

Professional Standard - Aviation, Photoelectrochemistry

• HB/Z 29-1981 Electrochemical polishing process
• HB 5059-1977 Electrochemical Polishing Quality Inspection
• HB/Z 5105-1978 Electrochemical polishing solution analysis method

(U.S.) Ford Automotive Standards, Photoelectrochemistry

• FORD SS-M99P9003-A-1992 ELECTROPOLISHING, STAINLESS STEEL

Korean Agency for Technology and Standards (KATS), Photoelectrochemistry

• KS D 1899-2019 Methods for photoelectric emission spectrochemical analysis of electrolytic cathode copper
• KS D 2518-2015(2020) Methods for photoelectric emission spectrochemical analysis of cadmium metal
• KS D 1657-1981 Analysis method of photoelectric emission spectrochemical analysis of metal materials
• KS D 2518-2020 Methods for photoelectric emission spectrochemical analysis of cadmium metal
• KS D 1650-1993 General rules for photoelectric emission spectrochemical analysis of metal materials
• KS D 1929-2019 Methods for photoelectric emission spectrochemical analysis of die casting zinc alloys
• KS D 1929-2004 Methods for photoelectric emission spectrochemical analysis of die casting zinc alloys
• KS M 0129-2013(2018) Technical terms for analytical chemistry(Optical part)
• KS D 1852-2015 Methods for photoelectric emission spectrochemical analysis of aluminium and aluminium alloys
• KS D 1852-2020 Methods for optical emission spectrochemical analysis of aluminium and aluminium alloys
• KS M 0028-2009(2019) General rules for light emission spectrochemical analysis
• KS D 1852-2005 Methods for photoelectric emission spectrochemical analysis of aluminium and aluminium alloys
• KS M 0129-2013 Technical terms for analytical chemistry(Optical part)
• KS M 0006-2010 Test methods for optical rotation of chemical products
• KS D 1653-1991 Method of spectrochemica analysis
• KS M 0129-2023 Technical terms for analytical chemistry(Optical part)
• KS D ISO 14707:2003 Surface chemical analysis-Glow discharge optical emission spectrometry (GD-OES)-Introduction to use
• KS M 0028-2019 General rules for light emission spectrochemical analysis
• KS D ISO 15472-2003(2018) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
• KS D 1899-1993 Methods for emission spectrochemical analysis of electrolytic cathode copper
• KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
• KS D ISO 19318:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
• KS M 0006-2010(2020) Test methods for optical rotation of chemical products
• KS M 0006-1995 Test methods for optical rotation of chemical products
• KS D 1650-2008(2018) General rules for photoelectric emission spectrochemical analysis of metal materials

Japanese Industrial Standards Committee (JISC), Photoelectrochemistry

• JIS H 1103:1995 Method for photoelectric emission spectrochemical analysis of electrolytic cathode copper
• JIS H 1123:1995 Method for photoelectric emission spectrochemical analysis of lead metal
• JIS H 1163:1991 Method for photoelectric emission spectrochemical analysis of cadmium metal
• JIS H 1113:2022 Method for photoelectric emission spectrochemical analysis of zinc metal
• JIS K 0213:2014 Technical terms for analytical chemistry (Electrochemistry part)
• JIS H 1560:2016 Method for photoelectric emission spectrochemical analysis of die casting zinc alloys
• JIS H 1305:1976 Method for photoelectric emission spectrochemical analysis of aluminium and aluminium alloy
• JIS Z 2611:1977 General rules for photoelectric emission spectrochemical analysis of metal materials
• JIS K 0212:2016 Technical terms for analytical chemistry (optical part)
• JIS K 0212:2007 Technical terms for analytical chemistry (optical part)
• JIS K 0212:1990 Technical terms for analytical chemistry (optical part)
• JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Photoelectrochemistry

• GB/T 23141-2008 Photochemical, photoaging long-arc xenon lamp
• GB/T 19502-2023 Surface chemical analysis—General rules for glow discharge optical emission spectrometry (GD-OES)
• GB/T 19502-2004 Surface chemical analysis-Glow discharge optical emission spectrometry(GD-OSE)-Introduction to use

International Commission on Illumination (CIE), Photoelectrochemistry

• CIE 134-1999 CIE Collection in Photobiology and Photochemistry 1999
• CIE 138-2000 CIE Collection in Photobiology and Photochemistry 2000

International Organization for Standardization (ISO), Photoelectrochemistry

• ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
• ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
• ISO 22576:2020 Optics and photonics — Optical materials and components — Specification of calcium fluoride used in the infrared spectrum
• ISO 9211-2:2010 Optics and photonics - Optical coatings - Part 2: Optical properties
• ISO 9211-1:2018 Optics and photonics - Optical coatings - Part 1: Vocabulary
• ISO 9211-1:2010 Optics and photonics - Optical coatings - Part 1: Definitions
• ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
• ISO 12123:2010 Optics and photonics - Specification of raw optical glass
• ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
• ISO 24417:2022 Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
• ISO/TS 25138:2019 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• ISO/TS 15338:2020 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
• ISO/TS 25138:2010 Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• ISO 5398-4:2007 | IULTCS/IUC 8-4 Leather — Chemical determination of chromic oxide content — Part 4: Quantification by inductively coupled plasma - optical emission spectrometer (ICP-OES)
• ISO 19318:2021 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
• ISO 19318:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
• ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution

British Standards Institution (BSI), Photoelectrochemistry

• BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
• BS EN 2591-602:2001 Elements of electrical and optical connection - Test methods - Optical elements - Variation of attenuation and optical discontinuity
• BS ISO 11505:2013 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
• BS EN 2591-6305:2001 Elements of electrical and optical connection. Test methods - Optical elements. Rapid change of temperature
• BS DD ISO/TS 25138:2011 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• BS ISO 14707:2015 Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
• BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
• BS ISO 14707:2000 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
• BS EN 2591:6305:2001 Elements of electrical and optical connection - Test methods - Optical elements - Rapid change of temperature
• BS EN 2591-603:2002 Elements of electrical and optical connection - Test methods - Optical elements - Change of power distribution
• BS ISO 22576:2020 Optics and photonics. Optical materials and components. Specification of calcium fluoride used in the infrared spectrum
• BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
• PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
• BS EN 62496-2-2:2011 Optical circuit boards. Measurements. Dimensions of optical circuit boards
• BS ISO 25297-1:2012 Optics and photonics. Electronic exchange of optical data. NODIF information model
• BS EN 60794-4-10:2007 Optical fibre cables - Aerial optical cables along electrical power lines - Family specification for OPGW (optical ground wires)
• 19/30362632 DC BS ISO 22576. Optics and photonics. Optical materials and components. Specification of calcium fluoride used in the infrared spectrum
• BS ISO 14707:2021 Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
• BS EN 60794-4-10:2014 Optical fibre cables. Family specification. Optical ground wires (OPGW) along electrical power lines
• BS EN 14726:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis
• BS ISO 9022-9:2016 Optics and photonics. Environmental test methods. Solar radiation and weathering
• BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
• BS ISO 19318:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
• BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution

Professional Standard - Aerospace, Photoelectrochemistry

• QJ 466-1988 Specifications for Electrochemical Polishing of Stainless Steel
• QJ 466-1979 Specifications for Electrochemical Polishing of Stainless Steel
• QJ/Z 64-1979 Stainless Steel Electrochemical Polishing Production Instructions
• QJ/Z 100-1982 Analytical method of electrochemical polishing solution for stainless steel

GOSTR, Photoelectrochemistry

• GOST 7329-1991 Chemical laboratory and electrovacuum glassware. Polarizable and optical method of path-length difference measuring
• GOST R 58566-2019 Optics and photonics. Lenses for optical electronic systems. Test methods

Standard Association of Australia （SAA）, Photoelectrochemistry

• AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
• AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
• AS ISO 24237:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
• AS 2534:1997 Lead and lead alloys - Sampling for chemical and spectrochemical analysis
• AS 2534:1997(R2016) Lead and lead alloys - Sampling for chemical and spectrochemical analysis
• AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
• AS 2612:1997(R2016) Aluminium and aluminium alloys - Sampling for chemical and spectrochemical analysis
• AS 2612:1997 Aluminium and aluminium alloys - Sampling for chemical and spectrochemical analysis

Professional Standard - Commodity Inspection, Photoelectrochemistry

• SN/T 2260-2010 Determination chemical compounds of copper cathode-Photoeletric emission spectroscopic method

RO-ASRO, Photoelectrochemistry

• STAS 12676-1988 OPTICAL GLASS Determination of optical density variation at ionizing radiations action
• STAS 11995-1983 OPTICAL GLASS Chemical stability determination

American National Standards Institute （ANSI), Photoelectrochemistry

• ANSI/TIA-455-20-B-2004 Fiber Optics - Measurement of Change in Optical Transmittance
• ANSI/OEOSC OP1.002-2009 Optics and Electro-Optical Instruments - Optical Elements and Assemblies - Appearance Imperfections

未注明發(fā)布機構, Photoelectrochemistry

• JIS H 1560:2023 Method for photoelectric emission spectrochemical analysis of die casting zinc alloys

Professional Standard - Military and Civilian Products, Photoelectrochemistry

• WJ 463-1995 Specification for aluminum and aluminum alloy anodic oxide coatings for optical instruments with electrochemical coatings

Taiwan Provincial Standard of the People's Republic of China, Photoelectrochemistry

• CNS 6490-1980 Technical Terms for Analytical Chemistry(Optical Part)
• CNS 1731-1998 Fluorescein sodium (reagent)
• CNS 1688-1965 Diiodofluorescein
• CNS 1683-1965 Dichlorofluorescein

中華人民共和國國家質(zhì)量監(jiān)督檢驗檢疫總局、中國國家標準化管理委員會, Photoelectrochemistry

• GB/T 32996-2016 Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry

Association Francaise de Normalisation, Photoelectrochemistry

• NF ISO 14707:2006 Analyse chimique des surfaces - Spectrométrie d'émission optique à décharge luminescente - Introduction à son emploi
• NF A06-590:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis.
• NF X21-053*NF ISO 14707:2006 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
• NF S10-019:2010 Optics and photonics - Specification of raw optical glass.
• NF A06-702:1967 Chemical analysis of copper and its alloys. Spectrophotometric determination of residual copper in the electrolysate.
• NF A06-819:1968 Analyse chimique du zinc - Dosage spectrophotométrique de l'indium
• NF EN 2591-602:2002 Aerospace series - Electrical and optical connection members - Test methods - Part 602: optical members - Variation of attenuation and optical discontinuity
• NF S12-200*NF EN ISO 15253:2021 Ophthalmic optics and instruments - Optical and electro-optical devices for enhancing low vision
• NF S10-043*NF ISO 9358:1998 Optics and optical instruments. Veiling glare of image-forming systems. Definitions and methods of measurement.
• NF L54-002-084*NF EN 2591-602:2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 602 : optical elements - Variation of attenuation and optical discontinuity
• NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.

German Institute for Standardization, Photoelectrochemistry

• DIN EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis; German version EN 14242:2004
• DIN EN 2591-604:2002 Aerospace series - Elements of electrical and optical connection; Test methods - Part 604: Optical elements; Cleaning capability of optical face; German and English version EN 2591-604:2001
• DIN EN 14242 E:2022-01 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis
• DIN ISO 9211-2:2012 Optics and photonics - Optical coatings - Part 2: Optical properties (ISO 9211-2:2010)
• DIN ISO 14707 E:2017-09 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
• DIN ISO 14707 E:2022-08 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use

European Committee for Standardization (CEN), Photoelectrochemistry

• EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis

SCC, Photoelectrochemistry

• BS PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• BS DD ISO/TS 25138:2010 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• AWWA QTC97021 Catalytic Photochemical Oxidation of NOM in Drinking Water
• BS ISO 25297-1:2010 Optics and photonics. Electronic exchange of optical data-NODIF information model
• NS-EN 2591-602:2001 Aerospace series — Elements of electrical and optical connection — Test methods — Part 602: Optical elements — Variation of attenuation and optical discontinuity
• DANSK DS/EN 2591-602:2001 Aerospace series - Elements of electrical and optical connection - Test methods - Part 602: Optical elements - Variation of attenuation and optical discontinuity
• 06/30154411 DC ISO 25297. Optics and photonics. Fundamental standards. Electronic exchange of optical data
• MIL MIL-I-42073-1990 INSERT, OPTICAL, CHEMICAL-BIOLOGICAL MASK, XM-40
• ASTM C761-01 Standard Test Methods for Chemical, Mass Spectrometric, Spectrochemical, Nuclear, and Radiochemical Analysis of Uranium Hexafluoride

Professional Standard - Meteorology, Photoelectrochemistry

• QX/T 240-2014 Identification of photochemical smog
• QX/T 241-2014 Grades of photochemical smog

國家市場監(jiān)督管理總局、中國國家標準化管理委員會, Photoelectrochemistry

• GB/T 40658-2021 Potassium bromide optical elements

Professional Standard - Chemical Industry, Photoelectrochemistry

• HG/T 3494-1999 Chemical reagent.Fluorescein
• HG/T 4743-2014 Low chemical processing violet photopolymer CTP plates
• HG/T 6227-2023 Analysis method of chemical composition of catalytic cracking catalyst X-ray fluorescence spectrometry

KR-KS, Photoelectrochemistry

• KS D ISO 14707-2003(2023) Surface chemical analysis - Glow discharge emission spectroscopy (GD-OES) - Introduction
• KS M 0129-2013(2023) Technical terms for analytical chemistry(Optical part)

GSO, Photoelectrochemistry

• GSO ISO/TS 25138:2013 Surface chemical analysis -- Analysis of metal oxide films by glow-discharge optical-emission spectrometry
• BH GSO ISO 14707:2016 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
• OS GSO ISO 14707:2013 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
• GSO ISO 14707:2013 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
• GSO ISO 15254:2015 Ophthalmic optics and instruments -- Electro-optical devices for enhancing low vision
• GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
• GSO ISO 11505:2015 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

RU-GOST R, Photoelectrochemistry

• GOST 1367.11-1983 Antimony. Chemical-spectral method of analysis
• GOST 12224.1-1978 Osmimum. Chemical-spectral method of analysis
• GOST 32434-2013 Testing of chemicals of environmental hazard. Phototransformation of chemicals in water. Directphotolysis
• GOST 13917-1992 Optical materials. Methods for determination of chemical stability. Groups of chemical stability
• GOST R 59605-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Terms and definitions
• GOST 12645.9-1983 Indium. Chemical spectral method for determination of thallium

Professional Standard - Machinery, Photoelectrochemistry

• JB/T 7777.4-1995 Silver tin oxide indium oxide electrical contact material chemical analysis method PAN spectrophotometric determination of zinc content
• JB/T 7774.3-1995 Method for chemical analysis of silver zinc oxide electrical contact materials Determination of bismuth content by thiourea spectrophotometry
• JB/T 7776.6-1995 Method for chemical analysis of silver cadmium oxide electrical contact materials Determination of bismuth content by thiourea spectrophotometry
• JB/T 7776.5-1995 Method for chemical analysis of silver cadmium oxide electrical contact materials Lufenone spectrophotometric method Determination of tin content
• JB/T 7777.3-1995 Silver tin oxide indium oxide electrical contact materials chemical analysis method dimethylglyoxime spectrophotometric determination of nickel content
• JB/T 7778.2-1995 Method for chemical analysis of silver tungsten carbide electrical contact materials - Determination of nickel content by dimethylglyoxime luminescence photometry
• JB/T 7776.8-1995 Silver cadmium oxide electrical contact material chemical analysis method Mingtianqing S spectrophotometric method for determination of aluminum content
• JB/T 7777.4-2008 Test methods for chemical analysis of silver-tin oxide-indium oxide electric contact material.Part 4:Determination of zinc content

American Society for Testing and Materials (ASTM), Photoelectrochemistry

• ASTM RR-C26-1000 1976 C0791-Methods for Chemical, Mass Spectrometric, Spectrochemical Analysis of Nuclear-Grade Boron Carbide
• ASTM C791-04 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
• ASTM C791-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
• ASTM C761-18 Standard Test Methods for Chemical, Mass Spectrometric, Spectrochemical, Nuclear, and Radiochemical Analysis of Uranium Hexafluoride

Defense Logistics Agency, Photoelectrochemistry

• DLA A-A-55135 VALID NOTICE 2-2011 LIGHT, CHEMILUMINESCENT, 6 IN - 5 IN - C
• DLA A-A-55432 VALID NOTICE 2-2011 Light, Chemiluminescent, 15 In- 12 Hr- B, E, F
• DLA A-A-55433 VALID NOTICE 2-2011 Light, Chemiluminescent, 15 In - 8 Hr - A, G
• DLA A-A-55132 VALID NOTICE 2-2011 LIGHT, CHEMILUMINESCENT, 6-IN - 30 MIN E, F
• DLA A-A-55434 VALID NOTICE 2-2011 LIGHT, CHEMILUMINESCENT, 4 IN - 6 HR - B, C

Military Standards (MIL-STD), Photoelectrochemistry

• DOD MIL-I-42073-1990 INSERT, OPTICAL, CHEMICAL-BIOLOGICAL MASK, XM-40

TR-TSE, Photoelectrochemistry

• TS 1045-1971 CHEMICAL ANALYSIS OF ZINC SPECTROPHOTOMETRIC DETERMINATION OF COPPER
• TS 653-1968 CHEMICAL ANALYSIS OF STEELS DETERMINATION OF MANGANESE (SPECTROPHOTOMETRIC METHOD)

BSI, Photoelectrochemistry

• BS ISO 8237:2024 Optics and photonics. Optical materials and components. Specification of chalcogenide glass used in the infrared spectrum

National Metrological Verification Regulations of the People's Republic of China, Photoelectrochemistry

• JJG 801-2004 Chemiluminescent NO/NOx Analyzers

Spanish Association for Standardization (UNE), Photoelectrochemistry

• UNE-EN 2591-602:2001 Aerospace series. Elements of electrical and optical connection. Test methods. Part 602: Optical elements. Variation of attenuation and optical discontinuity. (Endorsed by AENOR in April of 2002.)

Professional Standard - Nuclear Industry, Photoelectrochemistry

• EJ/T 520-1990 Bio-chemiluminescence tester

Danish Standards Foundation, Photoelectrochemistry

• DS/EN 2591-602:2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 602: Optical elements - Variation of attenuation and optical discontinuity

Lithuanian Standards Office , Photoelectrochemistry

• LST EN 2591-602-2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 602: Optical elements - Variation of attenuation and optical discontinuity

HU-MSZT, Photoelectrochemistry

• MNOSZ 23764-1952 Chemicals, electrochemical aluminum

Others:   Photoionization, Photoelectrochemistry, Special photoelectric, photoelectric spectrum, Photoelectric calibration, Photoelectric Ceramics, photovoltage, Photoelectrochemistry, Photoelectric coding, Photoelectrochemical analysis, Photocurrent, Photoelectric properties, Photoelectric direct reading, Photoelectric test, Element Optoelectronics, Photoelectric instrument, Photoelectric material, Spectrum photoelectric, Optical parameters.