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DESemiconductor photoelectric properties
Semiconductor photoelectric properties, Total:112 items.
In the international standard classification, Semiconductor photoelectric properties involves: Optoelectronics. Laser equipment, Semiconductor devices, Characteristics and design of machines, apparatus, equipment, Fibre optic communications, Electricity. Magnetism. Electrical and magnetic measurements, Integrated circuits. Microelectronics, Optics and optical measurements, Thermodynamics and temperature measurements, Medical equipment.
RO-ASRO, Semiconductor photoelectric properties
- STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
- STAS 12258/7-1987 OPTOELECTRONIC SEMICONDIC- TOH DEVICES PHOTOVOLTAIC CELLS Terminology and essential cliarac! eristics
- STAS 12258/2-1984 Optoelectronic semiconductor devices PIIOTODIODES Terminology and essentia] characteristics
- STAS 12258/5-1986 OPTOELECTRONIG SEMICONDUCTOR DEVICES DISPLAYS Terminology and essential characteristres
- STAS 12258/4-1986 Optoelectronic semiconductor devices LIGHT EMITTING DIODES Terminology and main characteristics
- STAS 12258/6-1987 OPTOELECTRONIC SEMICON- DUCTOR DEVICES INFRARED EMM1TING DIODES Terminology and essential characteristics
Military Standard of the People's Republic of China-General Armament Department, Semiconductor photoelectric properties
- GJB 8120-2013 General specification for semiconductor optoelectronic module
- GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
- GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
- GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
- GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
- GJB 8121-2013 General specification for semiconductor optoelectronic assembly
- GJB 8119-2013 General specification for semiconductor optoelectronic device
- GJB 33/15-2011 Semiconductor optoelectronic device.Detail specification for type BT401 semiconductor infrared-emitting diode
British Standards Institution (BSI), Semiconductor photoelectric properties
- BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
- BS EN 62007-1:2000 Semiconductor optoelectronic devices for fibre optic system applications - Essential ratings and characteristics
- BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
- BS EN 62007-1:2009 Semiconductor optoelectronic devices for fibre optic system applications - Specification template for essential ratings and characteristics
- BS EN 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications. Specification template for essential ratings and characteristics
- BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
- BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for thermal characteristics of flexible materials
- BS IEC 60747-18-4:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
- 19/30404095 DC BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers
- 23/30473272 DC BS IEC 60747-5-4 AMD 1. Semiconductor devices - Part 5-4. Optoelectronic devices. Semiconductor lasers
- BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
- BS EN IEC 62007-1:2015+A1:2022 Semiconductor optoelectronic devices for fibre optic system applications - Specification template for essential ratings and characteristics
- BS EN 62007-2:2000 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
- BS IEC 60747-18-5:2023 Semiconductor devices - Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
- BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
- BS EN 60747-5-2:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 2 : Optoelectronic devices — Essential ratings and characteristics
- BS EN 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Measuring methods
- BS EN 60747-5-5:2011 Semiconductor devices. Discrete devices. Optoelectronic devices. Photocouplers
- BS EN 60747-5-2:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Essential ratings and characteristics
- BS IEC 60747-18-3:2019 Semiconductor devices. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
- BS EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Essential ratings and characteristics
RU-GOST R, Semiconductor photoelectric properties
- GOST 17772-1988 Semiconducting photoelectric detectors and receiving photoelectric devices. Methods of measuring photoelectric parameters and determining characteristics
- GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
- GOST R 59607-2021 Optics and photonics. Semiconducting photoelectric detectors. Photoelectric and photoreceiving devices. Methods of measuring photoelectric parameters and determining characteristics
International Electrotechnical Commission (IEC), Semiconductor photoelectric properties
- IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 62007-1:1997 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
- IEC 62007-1:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
- IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- IEC 62007-1/AMD1:1998 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics; Amendment 1
- IEC 62007-1:2015+AMD1:2022 CSV Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
- IEC 62951-4:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
- IEC 60747-5-2:2009 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
- IEC 62007-1:2008 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
- IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
- IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- IEC 62951-5:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
- IEC 60747-5-2:1997/AMD1:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices; Essential ratings and characteristics; Amendment 2
YU-JUS, Semiconductor photoelectric properties
KR-KS, Semiconductor photoelectric properties
- KS C IEC 62007-1-2003(2023) Semiconductor photovoltaic devices for optical communication systems - Part 1: Important classes and characteristics
- KS C IEC 60747-5-2-2020 Discrete semiconductor devices and integrated circuits —Part 5-2: Optoelectronic devices — Essential ratings and characteristics
German Institute for Standardization, Semiconductor photoelectric properties
- DIN 4000-20:1988 Tabular layouts of article characteristics for opto-electronic semiconductor devices
Korean Agency for Technology and Standards (KATS), Semiconductor photoelectric properties
- KS C IEC 62007-1:2003 Semiconduct optoelectronic devices for fibre optic system applications ? Part 1：Essential ratings and characteristics
- KS C IEC 62007-1-2003(2018) Semiconductor photovoltaic devices for optical communication systems - Part 1: Important classes and characteristics
- KS C IEC 60747-5-2:2020 Discrete semiconductor devices and integrated circuits —Part 5-2: Optoelectronic devices — Essential ratings and characteristics
SCC, Semiconductor photoelectric properties
- 12/30261676 DC BS EN 62779-2. Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances
- IEC 62007-1:1997+AMD1:1998 CSV Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
- BS 3363:1961 Schedule of letter symbols for light-current semiconductor devices
- CEI EN 60747-5-2:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- DANSK DS/EN 60747-5-2:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- DANSK DS/EN 60747-5-2/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- BS EN 60747-5-5:2011+A1:2015 Semiconductor devices. Discrete devices-Optoelectronic devices. Photocouplers
Professional Standard - Electron, Semiconductor photoelectric properties
- SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810
- SJ 20642-1997 Semiconductor opto-electronic module General specification for
- SJ 20786-2000 General specification for semiconductor opto-electronic assembly
- SJ 50033/109-1996 Semiconductor optoelectronic devices.Detail specification for types GJ9031T and GJ9032T and GJ9034T semiconductor laser diodes
- SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
- SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
- SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
- SJ 50033/111-1996 Semiconductor optoelectronic devices.Delail specification for type GT16 Si.NPN phototransistor
GSO, Semiconductor photoelectric properties
- OS GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- BH GSO IEC 60747-5-4:2016 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- BH GSO IEC 60747-5-2:2016 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- GSO IEC 60747-5-2:2014 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- BH GSO IEC 60747-5-7:2022 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
- GSO IEC 60747-5-7:2021 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor photoelectric properties
- GB 15651.4-2017 Semiconductor devices Discrete devices Part 5-4: Optoelectronic devices Semiconductor lasers
- GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
- GB/T 13974-1992 Test methods for semiconductor deviece curve tracers
- GB/T 15167-1994 General specification for light source of semiconductor lasers
- GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
- GB/T 15651.2-2003/IEC 60747-5-2:1997 Semiconductor discrete devices and integrated circuits - Part 5-2: Basic ratings and characteristics of optoelectronic devices
中華人民共和國(guó)國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), Semiconductor photoelectric properties
- GB/T 15651.4-2017 Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers
CZ-CSN, Semiconductor photoelectric properties
- CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
- CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
Professional Standard - Post and Telecommunication, Semiconductor photoelectric properties
- YD/T 2001.1-2009 Semiconductor optoelectronic devices for fibre optic system applications.Part 1:Specification template for essential rating and characteristics
Taiwan Provincial Standard of the People's Republic of China, Semiconductor photoelectric properties
- CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
CENELEC - European Committee for Electrotechnical Standardization, Semiconductor photoelectric properties
- EN 62007-1:2000 Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 1: Essential Ratings and Characteristics
Hebei Provincial Standard of the People's Republic of China, Semiconductor photoelectric properties
- DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer
Group Standards of the People's Republic of China, Semiconductor photoelectric properties
ITU-T - International Telecommunication Union/ITU Telcommunication Sector, Semiconductor photoelectric properties
- ITU-T K.28 SPANISH-1993 CHARACTERISTICS OF SEMI-CONDUCTOR ARRESTER ASSEMBLIES FOR THE PROTECTION OF TELECOMMUNICATIONS INSTALLATIONS
Association Francaise de Normalisation, Semiconductor photoelectric properties
- NF C93-801-1:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics.
- NF C93-801-1*NF EN 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics
- NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
- NF EN 60747-5-2/A1:2003 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-2 : dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
- NF EN 60747-5-2:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-2 : dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
- NF C96-005-2*NF EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits - Part 5-2 : optoelectronic devices - Essential ratings and characteristics
- NF C96-005-2/A1*NF EN 60747-5-2/A1:2003 Discrete semiconductor devices and integrated circuits - Partie 5-2 : optoelectronic devices - Essential ratings and characteristics
National Metrological Technical Specifications of the People's Republic of China, Semiconductor photoelectric properties
- JJF 1236-2010 Calibration Specification for Semiconductor Device Curve Tracers
Danish Standards Foundation, Semiconductor photoelectric properties
- DS/EN 60747-5-2:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
- DS/EN 60747-5-2/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
Jilin Provincial Standard of the People's Republic of China, Semiconductor photoelectric properties
Spanish Association for Standardization (UNE), Semiconductor photoelectric properties
- UNE-EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices - Essential ratings and characteristics. (Endorsed by AENOR in October of 2001.)
- UNE-EN 60747-5-2:2001/A1:2002 Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices - Essential ratings and characteristics (Endorsed by AENOR in November of 2002.)
International Organization for Standardization (ISO), Semiconductor photoelectric properties
- ISO/TS 17915:2013 Optics and photonics.Measurement method of semiconductor lasers for sensing
IN-BIS, Semiconductor photoelectric properties
- IS 3700 Pt.11-1984 Basic ratings and characteristics of semiconductor devices Part 11 Light-emitting diodes